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| Product Name: |
IR Universal Sample Rack HW-1
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| Specifications |
IR Universal Sample Rack HW-1 |
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Product feature:Used for Fourier infrared spectrometer and infraredspectrophotometer to test irregular samples
Aperture:13mm
Sample placement:Windows, crystals, etc
Size:50 x70mm |
| Company: |
Tianjin Hench Technology Co., Ltd.
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| Contact: |
Mr. hcftir Bai |
| Address: |
Hench Technology, 3rd Floor, Gate A, Building 4, Shengji Group, Haitai Fazhan Erlu, Xiqing District, Tianjin |
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| Tel: |
15522429203 |
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